Mentor v8.6_4 User Manual

FastScan and FlexTest Reference Manual, V8.6_4

Tools Supported: FastScan and FlexTest

Scope: Atpg, Fault, and Good modes

Prerequisites: You must add faults with the Add Faults or Load Faults commands

before you can delete them.

Path Delay Faults Usage:

DELete FAults {object_pathname... | -All} [-Untestable] [-Both | -Rise | -Fall]

Stuck/Toggle/Iddq Faults Usage:

DELete FAults {object_pathname... | -All} [-Stuck_at {01 | 0 | 1}]
[-Untestable]

DELete FAults {object_pathname... | -Untestable | -All} [-Stuck_at {01 | 0 | 1}]

Removes faults from the current fault list.

The Delete Faults command deletes faults from the fault list added using the Add
Faults command or the Load Faults command.

You can optionally specify faults with a specific stuck-at value. If you do not
specify a stuck-at value when deleting a fault, the command deletes both the
“stuck-at-0” and “stuck-at-1” faults from the fault list.

When you issue this command, the tool discards all patterns in the current test
pattern. To save the current test patterns you must explicitly save them with the
Save Patterns command prior to issuing the Delete Faults command.

In addition to specifying faults with a specific stuck-at value, FastScan lets you
specify faults that are untestable. Untestable faults are common when using Built-
In Self-Test (BIST) techniques or random patterns. This includes faults which the
tool cannot detect due to either constraints or the use of a single capture clock.
This also includes faults on circuitry which do not have a scan propagable path to