Mentor v8.6_4 User Manual

FastScan and FlexTest Reference Manual, V8.6_4

Below is an alphabetical listing of the acronyms used in this manual:

ASIC - Application Specific IC

ATE - Automatic Test Equipment

ATPG - Automatic Test Pattern Generation

AU - ATPG_Untestable fault

AVI - ASIC Vector Interfaces

BIST - Built-In Self Test

BSDA - Boundary Scan Design Architect

BSDL - Boundary Scan Design Language

CUT - Circuit Under Test

DFT - Design For Test

DFTA - DFTAdvisor

DFTI - DFTInsight

DRC - Design Rules Check

DUT - Device Under Test

EDDM - Electronic Design Data Model

EDIF - Electronic Design Interchange Format

FS - FastScan

FT - FlexTest