Mentor v8.6_4 User Manual

FastScan and FlexTest Reference Manual, V8.6_4

Tools Supported: FastScan

Scope: Atpg, Good, and Fault modes

Prerequisites: You must specify the current pattern source with the Set Pattern

Source command.

REPort FAIlures [{pin_pathname -Stuck_at {0 | 1}} [-Max integer] [-Pdet]]

Displays the failing pattern results.

The Report Failures command performs either a good simulation or a fault
simulation depending on whether you provide any arguments. If you issue the
command without any arguments, the command performs a good machine
simulation. If you specify a pin and a stuck-at value, the command performs a
fault simulation for those values. In either case the command uses the current
pattern source (except random patterns) and displays information on any failing
patterns. The command presents the failing patterns information in “scan test” and
“chain test” format as follows:

•

“scan test” — For a failing response that occurs during the parallel measure
of the primary outputs, the command displays the following two columns:

o

The test pattern number that causes the failure.

o

The pin name of the failing primary output.

•

“chain test” — For a failing response that occurs during the unloading of
the scan chain, the command displays the following three columns:

o

The test pattern number that causes the failure.

o

The name of the scan chain where the failing scan cell is located.