Mentor v8.6_4 User Manual
Command Dictionary
Report Observe Data
FastScan and FlexTest Reference Manual, V8.6_4
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Report Observe Data
Tools Supported: FastScan
Scope: Atpg, Good, and Fault modes
Prerequisites: You must use the Analyze Observe command prior to this
command.
Usage
REPort OBserve Data [filename] [-Replace]
Description
Displays information from the preceding Analyze Observe command.
The Report Observe Data command displays a summary of the information that
FastScan obtained from the preceding Analyze Observe command.
FastScan obtained from the preceding Analyze Observe command.
When the Analyze Observe command fails to detect an output pin for a minimum
number of the random patterns (as defined by the observe threshold), FastScan
identifies the output pin as inadequately observed. For each inadequately-
observed output pin the Analyze Observe command searches for the potential
source of the pin’s observe problem. This it calculates by tracing forward from the
pin through the most difficult-to-observe fanout gate until it reaches a gate which
has no fanout and an observability value less than the threshold.
number of the random patterns (as defined by the observe threshold), FastScan
identifies the output pin as inadequately observed. For each inadequately-
observed output pin the Analyze Observe command searches for the potential
source of the pin’s observe problem. This it calculates by tracing forward from the
pin through the most difficult-to-observe fanout gate until it reaches a gate which
has no fanout and an observability value less than the threshold.
The Report Observe Data command’s summary report lists up to a maximum of
25 source gates, which, if made observable, would affect a maximum number of
other gates. The command orders the list of gates by the low-observability gates
and includes the low-observability pins, the number of times observed, and the
calculated source gate.
25 source gates, which, if made observable, would affect a maximum number of
other gates. The command orders the list of gates by the low-observability gates
and includes the low-observability pins, the number of times observed, and the
calculated source gate.
You can write the summary report to a file by specifying a filename.
You use this command primarily when simulating Built-In Self Test (BIST)
circuitry.
circuitry.