Mentor v8.6_4 User Manual

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Test Pattern File Formats
FastScan Test Pattern File Format
FastScan and FlexTest Reference Manual, V8.6_4
4-11
Scan_Cell
The scan_cell section contains the definition of the scan cells used in the circuit.
The scan cell data will be in the following format:
SCAN_CELLS =
   SCAN_GROUP “group_name1” =
      SCAN-CHAIN “chain_name1” =
         SCAN_CELL = <cellid> <type> <sciinv> <scoinv>
                     <relsciinv> <relscoinv> <instance_name>
                     <model_name> <input_pin> <output_pin>;
         ....
      END;
      SCAN_CHAIN “chain_name2” =
         SCAN_CELL = <cellid> <type> <sciinv> <scoinv>
                     <relsciinv> <relscoinv> <instance_name>
                     <model_name> <input_pin> <output_pin>;
         ....
      END;
      ....
   END;
   ....
END;
The fields for the scan cell memory elements are the following:
cellid - A number identifying the position of the scan cell in the scan chain.
The number 0 indicates the scan cell closest to the scan-out pin.
type - The type of scan memory element. The type may be MASTER,
SLAVE, SHADOW, OBS_SHADOW, COPY, or EXTRA.
sciinv - Inversion of the library input pin of the scan cell relative to the scan
chain input pin. The value may be T (inversion) or F (no inversion).
scoinv - Inversion of the library output pin of the scan cell relative to the
scan chain output pin. The value may be T (inversion) or F (no inversion).
relsciinv - Inversion of the memory element relative to the library input pin
of the scan cell. The value may be T (inversion) or F (no inversion).