Mentor v8.6_4 User Manual
FastScan and FlexTest Reference Manual, V8.6_4
2-68
Add Iddq Constraints
Command Dictionary
Add Iddq Constraints
Tools Supported: FastScan and FlexTest
FastScan Scope: Setup mode
FlexTest Scope: All modes
Usage
ADD IDdq Constraints {C0 | C1 | CZ} pinname... [-Model modelname]
Description
Sets constraints for generation or selection of IDDQ patterns.
Use the Add IDDQ Constraints command when you need constraints for either
IDDQ test generation or pattern selection.
IDDQ test generation or pattern selection.
Some CMOS models have some states for which they draw a quiescent current.
You can use the Add Iddq Constraints command to prevent these undesirable
states during the IDDQ measurement.
You can use the Add Iddq Constraints command to prevent these undesirable
states during the IDDQ measurement.
For test generation, you specify that the tool create patterns to detect the IDDQ
faults by using the Set Fault Type command. For pattern selection, you use the
Select IDDQ Patterns command.
faults by using the Set Fault Type command. For pattern selection, you use the
Select IDDQ Patterns command.
Arguments
•
C0
A literal that restricts the pinname to a constant zero state.
•
C1
A literal that restricts the pinname to a constant one state.
•
CZ
A literal that restricts the pinname to a high-impedance state.
Note
(FastScan Only): After using the Add IDDQ Constraints
command to set your design constraints, you must use the Set Iddq
Checks -Atpg command to ensure IDDQ restrictions are applied
during test generation.
command to set your design constraints, you must use the Set Iddq
Checks -Atpg command to ensure IDDQ restrictions are applied
during test generation.