Intel 200 User Manual

Page of 53
 
System Thermal/Mechanical Design Information 
 
 
Thermal and Mechanical Design Guidelines 
 37 
System Thermal/Mechanical 
Design Information 
4.1 
Overview of the Reference Design 
This chapter will document the requirements for designing a passive heatsink that 
meets the maximum usage power consumption that mentioned in Section 2.4.  The 
Intel
®
 Boxed Processor thermal solution E21953-001 satisfies the specified thermal 
requirements.   
Note:  The part number E21953-001 provided in this document is for reference only.  The 
revision number -001 may be subject to change without notice.  OEMs and System 
Integrators are responsible for thermal, mechanical and environmental validation of 
this solution (refer to Sections 4.1.2 and 4.2). 
The Intel
®
 Boxed Processor thermal solution E21953-001 takes advantage of cost 
savings.  The thermal solution supports the unique and smaller desktop PCs including 
small and ultra small form factors, down to a 5L system size.  
The motherboard keep-out and height recommendations shown in Section 2.1 remai
the same for a thermal solution for the Intel Celeron processor 200 sequence in the 
micro-FCBGA package.  
4.1.1 
Altitude 
Many companies design products that must function reliably at high altitude, typically 
1,500 m [5,000 ft] or more.  Air-cooled temperature calculations and measurements 
at the test site elevation must be adjusted to take into account altitude effects like 
variation in air density and overall heat capacity.  This often leads to some 
degradation in thermal solution performance compared to what is obtained at sea 
level, with lower fan performance and higher surface temperatures.  The system 
designer needs to account for altitude effects in the overall system thermal design to 
make sure that the T
S-TOP-MAX
 requirement for the processor is met at the targeted 
altitude. 
4.1.2 
Heatsink Thermal Validation 
Intel recommends evaluation of the heatsink within the specific boundary conditions 
based on the methodology described in Chapter 3.     
Testing is done on bench top test boards at ambient laboratory temperature.   
The test results, for a number of samples, are reported in terms of a worst-case mean 
+ 3σ value for thermal characterization parameter using real processors.