Cypress STK12C68 User Manual
STK12C68
Document Number: 001-51027 Rev. **
Page 8 of 20
Data Retention and Endurance
Parameter
Description
Min
Unit
DATA
R
Data Retention
100
Years
NV
C
Nonvolatile STORE Operations
1,000
K
Capacitance
In the following table, the capacitance parameters are listed.
Parameter
Description
Test Conditions
Max
Unit
C
IN
Input Capacitance
T
A
= 25
°C, f = 1 MHz,
V
CC
= 0 to 3.0 V
8
pF
C
OUT
Output Capacitance
7
pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
Parameter
Description
Test Conditions
28-SOIC
28-PDIP
(300 mil)
28-PDIP
(600 mil)
28-CDIP
28-LCC
Unit
Θ
JA
Thermal Resis-
tance
(Junction to
Ambient)
tance
(Junction to
Ambient)
Test conditions follow
standard test methods and
procedures for measuring
thermal impedance, per EIA /
JESD51.
standard test methods and
procedures for measuring
thermal impedance, per EIA /
JESD51.
46.55
45.16
55.84
46.1
95.31
°C/W
Θ
JC
Thermal Resis-
tance
(Junction to Case)
tance
(Junction to Case)
27.95
31.62
25.74
5.01
9.01
°C/W
Figure 6. AC Test Loads
AC Test Conditions
5.0V
Output
30 pF
R1 963
Ω
R2
512
Ω
5.0V
Output
5 pF
R1 963
Ω
R2
512
Ω
For Tri-state Specs
Input Pulse Levels .................................................. 0 V to 3 V
Input Rise and Fall Times (10% to 90%) ...................... <5 ns
Input and Output Timing Reference Levels .......................1.5
Input Rise and Fall Times (10% to 90%) ...................... <5 ns
Input and Output Timing Reference Levels .......................1.5
Note
6. These parameters are guaranteed by design and are not tested.