Atmel Xplained Pro Evaluation Kit ATSAM4E-XPRO ATSAM4E-XPRO Data Sheet
Product codes
ATSAM4E-XPRO
301
SAM4E [DATASHEET]
Atmel-11157D-ATARM-SAM4E16-SAM4E8-Datasheet_12-Jun-14
13.
Debug and Test Features
13.1
Description
The SAM4 Series Microcontrollers feature a number of complementary debug and test capabilities. The Serial
Wire/JTAG Debug Port (SWJ-DP) combining a Serial Wire Debug Port (SW-DP) and JTAG Debug (JTAG-DP) port
is used for standard debugging functions, such as downloading code and single-stepping through programs. It also
embeds a serial wire trace.
Wire/JTAG Debug Port (SWJ-DP) combining a Serial Wire Debug Port (SW-DP) and JTAG Debug (JTAG-DP) port
is used for standard debugging functions, such as downloading code and single-stepping through programs. It also
embeds a serial wire trace.
13.2
Embedded Characteristics
Debug access to all memory and registers in the system, including Cortex-M4 register bank when the core is
running, halted, or held in reset.
running, halted, or held in reset.
Serial Wire Debug Port (SW-DP) and Serial Wire JTAG Debug Port (SWJ-DP) debug access
Flash Patch and Breakpoint (FPB) unit for implementing breakpoints and code patches
Data Watchpoint and Trace (DWT) unit for implementing watchpoints, data tracing, and system profiling
Instrumentation Trace Macrocell (ITM) for support of printf style debugging
IEEE1149.1 JTAG Boundary-can on All Digital Pins