Atmel Xplained Pro Evaluation Kit ATSAM4E-XPRO ATSAM4E-XPRO Data Sheet
Product codes
ATSAM4E-XPRO
309
SAM4E [DATASHEET]
Atmel-11157D-ATARM-SAM4E16-SAM4E8-Datasheet_12-Jun-14
functions are implemented. In SWD/JTAG debug mode, the ARM processor responds with a non-JTAG chip ID
that identifies the processor. This is not IEEE 1149.1 JTAG-compliant.
that identifies the processor. This is not IEEE 1149.1 JTAG-compliant.
It is not possible to switch directly between JTAG Boundary Scan and SWJ Debug Port operations. A chip reset
must be performed after JTAGSEL is changed.
must be performed after JTAGSEL is changed.
A Boundary-scan Descriptor Language (BSDL) file to set up the test is provided on the
Atmel website at
http://www.atmel.com
.
13.6.9.1 JTAG Boundary-scan Register
The Boundary-scan Register (BSR) contains a number of bits which correspond to active pins and associated
control signals.
control signals.
Each SAM4 input/output pin corresponds to a 3-bit register in the BSR. The OUTPUT bit contains data that can be
forced on the pad. The INPUT bit facilitates the observability of data applied to the pad. The CONTROL bit selects
the direction of the pad.
forced on the pad. The INPUT bit facilitates the observability of data applied to the pad. The CONTROL bit selects
the direction of the pad.
For more information, please refer to BDSL files available for the SAM4 Series.