Atmel ARM-Based Evaluation Kit for SAM4S16C, 32-Bit ARM® Cortex® Microcontroller ATSAM4S-WPIR-RD ATSAM4S-WPIR-RD Data Sheet

Product codes
ATSAM4S-WPIR-RD
Page of 1231
SAM4S Series [DATASHEET]
Atmel-11100G-ATARM-SAM4S-Datasheet_27-May-14
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13.5
Functional Description
13.5.1 Test Pin
One dedicated pin, TST, is used to define the device operating mode. When this pin is at low level during power-
up, the device is in normal operating mode. When at high level, the device is in test mode or FFPI mode. The TST 
pin integrates a permanent pull-down resistor of about 15 kW,so that it can be left unconnected for normal 
operation. Note that when setting the TST pin to low or high level at power up, it must remain in the same state 
during the duration of the whole operation. 
13.5.2 Debug Architecture
 shows the Debug Architecture used in the SAM4. The Cortex-M4 embeds four functional units for 
debug:
SWJ-DP (Serial Wire/JTAG Debug Port)
FPB (Flash Patch Breakpoint)
DWT (Data Watchpoint and Trace)
ITM (Instrumentation Trace Macrocell)
TPIU (Trace Port Interface Unit)
The debug architecture information that follows is mainly dedicated to developers of SWJ-DP Emulators/Probes 
and debugging tool vendors for Cortex-M4 based microcontrollers. For further details on SWJ-DP see the Cortex-
M4 technical reference manual.
Figure 13-4.
Debug Architecture
13.5.3 Serial Wire/JTAG Debug Port (SWJ-DP)
The Cortex-M4 embeds a SWJ-DP Debug port which is the standard CoreSight
 debug port. It combines Serial 
Wire Debug Port (SW-DP), from 2 to 3 pins and JTAG debug Port (JTAG-DP), 5 pins.
By default, the JTAG Debug Port is active. If the host debugger wants to switch to the Serial Wire Debug Port, it 
must provide a dedicated JTAG sequence on TMS/SWDIO and TCK/SWCLK which disables JTAG-DP and 
enables SW-DP. 
4 watchpoints
PC sampler
data address sampler
data sampler
interrupt trace
CPU statistics
DWT
6 breakpoints
FPB
software trace
32 channels
time stamping
ITM
SWD/JTAG
SWJ-DP
SWO trace
TPIU