Atmel SAM4L Xplained Pro Evaluation Kit Atmel ATSAM4L-XPRO ATSAM4L-XPRO Data Sheet

42023E–SAM–07/2013

This instruction selects the Bypass register as Data Register. The device output pins are driven
from the boundary-scan chain.

Starting in Run-Test/Idle, the CLAMP instruction is accessed the following way:

1.

Select the IR Scan path.

2.

In Capture-IR: The IR output value is latched into the shift register.

3.

In Shift-IR: The instruction register is shifted by the TCK input.

4.

In Update-IR: The data from the boundary-scan chain is applied to the output pins.

5.

Return to Run-Test/Idle.

6.

Select the DR Scan path.

7.

In Capture-DR: A logic ‘0’ is loaded into the Bypass Register.

8.

In Shift-DR: Data is scanned from TDI to TDO through the Bypass register.

9.

Return to Run-Test/Idle.

CLAMP Details

IR input value

0101 (0x5)

IR output value

p00s

DR Size

1

DR input value

x

DR output value

x