Hitachi Microscope & Magnifier S-4800 User Manual
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1.1.9 Disturbance by Sound Waves
Sound waves (vibrations of air) adversely affect the Model S-4800 regardless of their frequency
and may cause image trouble. To prevent this, confirm before installation that equipment which
may cause a sonic disturbance is not located in the vicinity of the S-4800. If such equipment
exists, then check for noise level.
In general, as the frequency of noise increases, the sound pressure level decreases, and the
frequency of noise varies depending on the cause of noise. It is therefore necessary to carry
out noise frequency analysis at the installation location of the S-4800 SEM to check the degree
of noise (effective factor) in each case.
1.1.10 Site Requirements
1.1.10 Site requirements
(1) Space
Sound waves (vibrations of air) adversely affect the Model S-4800 regardless of their frequency
and may cause image trouble. To prevent this, confirm before installation that equipment which
may cause a sonic disturbance is not located in the vicinity of the S-4800. If such equipment
exists, then check for noise level.
In general, as the frequency of noise increases, the sound pressure level decreases, and the
frequency of noise varies depending on the cause of noise. It is therefore necessary to carry
out noise frequency analysis at the installation location of the S-4800 SEM to check the degree
of noise (effective factor) in each case.
1.1.10 Site Requirements
1.1.10 Site requirements
(1) Space
required
A room of about 3.4
×
3.0 m is desirable.
(2) Minimum dimensions of entrance
0.95 (W)
×
1.7 (H) m
(3) Durability of floor
Floor loading capability (kg / m )
3
Total mass of equipment (kg)
Floor area of the room (m )
2
2
≥
(4) Instrument
layout
See Fig. 1-2 for the layout example.
Frequency : f (Hz) Allowable Noise Level（Type I） Allowable Noise Level (Type II）
ｆ≦150
75 dB or less
72 dB or less
150≦ｆ≦800
60 dB or less
60 dB or less
800≦ｆ≦2000
54 dB or less
52 dB or less