GE UTxx Data Sheet

GE

Measurement & Control

UTxx-V72.4x

UTxx is a versatile ultrasound electronic platform for
industrial Nondestructive Testing (NDT) applications, 
testing machines, and on-line systems. Configurations
are available for single channel, up to 12 channels in a
rack or as multiple rack configuration.

Technical Specifications

Single Channel module

Up to 12 channels in a rack (parallel firing)

Multiple rack configuration possible

4 gates including Interface trigger gate

2 alarm levels per gate

10 ns TOF resolution

Backwall tracking gate

Sampling frequency of 100 MHz

24-bit amplitude/channel

5.2 ms long A-Scan

External PRF input, external acquisition trigger input

12 alarm outputs

USB2(72.41) or LAN(72.45) interface between hardware and PC

Min. 150 V negative square wave pulse in a 50 Ω load

Adjustable width 15 ns to 1.5 µs in 1ns steps

Max. PRF 20 KHz

Adjustable delay 0 to 16ms in 1ns step

15 Ω - 650 Ω output impedance adjustable in 5 Ω steps

4.5 µV pp - 45 V pp selectable input voltage (via software)

15 Ω - 650 Ω input impedance adjustable in 5 Ω steps

0.8 - 25 MHz bandwidth

120 dB dynamic range

120 dB gain control in 0.1 dB steps

120 dB TCG with 120 dB/40 ns slope

Programmable digital filter (0.1 MHz to 25 MHz)

Linear or logarithmic display

A-Scan compression

ALOK (Multi-peak/TOF detection)

Adjustable reject level

A-Scan envelope

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mentioned in this document may be trademarks or registered trademarks of their respective companies, which are not affiliated with GE.