Adtran Total Access 750 User Manual
4
Section 61175012L1-5, Issue 4
61175012L1-5D
Table 4. LED Indication
D
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:
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1
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1
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-
Table 3. Pinout Connectors for RJ-48 T1
Interface
4. TESTING
The TA 750 BCU provides a variety of test options
for both the Network T1 and DS0 access modules.
The faceplate of the BCU provides a bantam jack for
local T1 test access. DS0 test access for the digital
access modules (OCU DP, DS0 DP, U-BR1TE) is
provided via bantam jacks on the faceplate of each
unit.
for both the Network T1 and DS0 access modules.
The faceplate of the BCU provides a bantam jack for
local T1 test access. DS0 test access for the digital
access modules (OCU DP, DS0 DP, U-BR1TE) is
provided via bantam jacks on the faceplate of each
unit.
Faceplate Bantam Jack
The faceplate bantam jack provides a means to
monitor the network T1 connected to the rear of the
TA 750 chassis. The jacks accept standard 310-type
bantam plugs. Figure 2 displays where the bantam
jacks monitor the T1.
monitor the network T1 connected to the rear of the
TA 750 chassis. The jacks accept standard 310-type
bantam plugs. Figure 2 displays where the bantam
jacks monitor the T1.
Faceplate TEST connector
The faceplate DB-9 female TEST connector provides
the necessary clock output required by standard DS0
Logic Test equipment such as a TPI 108/109 test set.
Specifically, the TEST connector outputs 8 kHz and
64 kHz clock reference signal. Figure 3 illustrates the
DB-9 TEST connector.
the necessary clock output required by standard DS0
Logic Test equipment such as a TPI 108/109 test set.
Specifically, the TEST connector outputs 8 kHz and
64 kHz clock reference signal. Figure 3 illustrates the
DB-9 TEST connector.
DS0 test equipment is used to test DS0 access
modules such as the OCU DP, DS0 DP, or U-BR1TE.
Once the test equipment is connected to the reference
clock source, individual tests can be performed on
DS0 access modules using the faceplate bantam jacks
on each unit.
modules such as the OCU DP, DS0 DP, or U-BR1TE.
Once the test equipment is connected to the reference
clock source, individual tests can be performed on
DS0 access modules using the faceplate bantam jacks
on each unit.
Clock and Data
Recovery
MON IN
Test Jack
T1
RX
PAIR
Line Format
Decoder
To
Backplane
Receiver Circuitry
Transmitter Circuitry
MON OUT
Test Jack
Local
Loopback
Point
T1
TX
PAIR
From
Backplane
Line
Loopback
Point
Payload/CSU
Loopback
Point
Equalizer
Line Format
Encoder
DJAT
T1
R1
T
R
Figure 2. Bantam Jack Monitoring Points