GE HE500TIU050 User Manual
CH. 7: GETTING STARTED 06 Apr 2000 PAGE 35
GFK-1819
CHAPTER 7: GETTING STARTED
7.1 Self-Test
Power up the unit with the UP and ENTER keys pressed at the same time. The unit enters a self-test
mode. The self-test consists of the following four checks:
Power up the unit with the UP and ENTER keys pressed at the same time. The unit enters a self-test
mode. The self-test consists of the following four checks:
7.1.1 Contrast
Band
This test allows the user to set the lower and upper limits of contrast. Adjust the lower limit using the UP or DOWN
key and press Enter when done. Do the same for the upper limit.
key and press Enter when done. Do the same for the upper limit.
WARNING: - Changes to the lower or upper limits may allow the user to set the contrast to a
setting where the display may appear blank. It is recommended that the factory setting are used
(Min 8A, Max FE).
setting where the display may appear blank. It is recommended that the factory setting are used
(Min 8A, Max FE).
7.1.2 Display
Test
The display test continuously blinks all pixels on (black) to off. Look for any pixels stuck on or off. Exit
this test by pressing and holding any key for approximately two seconds.
this test by pressing and holding any key for approximately two seconds.
7.1.3 Keyboard
Test
As each key is pressed, an indication
***
appears above that key. In the case of units with a numeric
keypad, press the key and a message appears indicating the key press. Check for keys indicating
multiple presses or not reporting presses. Exit this test by pressing and holding any key for
approximately two seconds.
multiple presses or not reporting presses. Exit this test by pressing and holding any key for
approximately two seconds.
7.1.4 RAM
Test
Test either segment 0000 or segment 1000 (on the TIU100/110) of the RAM. The segment 1000 test
performs a base 3 repeating test. This test detects shorted address lines and damaged memory bits.
The segment 0000 test performs a Read-Modify-Write test on each byte of RAM, detecting damaged
memory bits. Exit this test by selecting DONE.
performs a base 3 repeating test. This test detects shorted address lines and damaged memory bits.
The segment 0000 test performs a Read-Modify-Write test on each byte of RAM, detecting damaged
memory bits. Exit this test by selecting DONE.
7.1.5
Serial Loop-back Tests
Tests the PC port and the Serial Port in each of it’s three modes for serial loop-back. Pre-made plugs are
required to link the pins of a particular port. This takes the following form:
required to link the pins of a particular port. This takes the following form:
Table 7.1 Loop-back Test Plugs
Port Tested
Product
Type of Connector
Pins to Short
PC (J2)
TIU100/110
Pin male D link connector
pin 2 to pin 3
RS-232 (J3)
TIU100/110
13-pin phoenix connection
pin 6 to pin 8
RS-422/485 (J3)
TIU100/110
13-pin phoenix connection
pin 2 to pin 4 and pin 3
to pin 5.
to pin 5.
Current Loop
TIU100/110
13-pin phoenix connection
pin 1 to 9, pin 10 to 11
and pin 12 to 7
and pin 12 to 7
PC
TIU050/101/102/1
03/112/113/20X
03/112/113/20X
Pin male D link connector
pin 2 to pin 3
RS-232
TIU050/101/102/1
03/112/113/20X
03/112/113/20X
8-pin phoenix connection
Pin 5 to pin 7
RS-422/485
TIU050/101/102/1
03/112/113/20X
03/112/113/20X
8-pin phoenix connection
Pin 1 to pin 3, Pin 2 to
pin 4
pin 4
NOTE: current loop in not installed on standard models, as such a standard model will fail the
current loop-back test. Current Loop is not an option on the TIU050/20X.
current loop-back test. Current Loop is not an option on the TIU050/20X.
After starting the test, the OK counter begins to count up. Exit this test by selecting DONE.