Mentor v8.6_4 Manual De Usuario

FastScan and FlexTest Reference Manual, V8.6_4

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Case 2: Capture Clock -Atpg

There will be 3 or 4 values in the last pair of ()s. The first three values result
from simulating a pulse of the capture clock with all other clocks set to the
off value.

If any state element has a different binary value than the one it had at the
end of simulation test setup, its value is changed to X, the effect is
propagated, and the final values are saved in the fourth value between the
()s.

Report Gates provides a shortcut to display data on the gate connected to the first
input of the previously reported gate. This lets you quickly and easily trace
backward through circuitry. To use Report Gates in this manner, first report on a
specific gate and then enter:

SETUP> b

The following example shows how to use Report Gate and B commands to trace
backward through the first input of the previously reported gate.

SETUP> rep gate 26

//  /u1/inst__565_ff_d_1__13 (26)  BUF
//      "I0"   I  269-
//      "OUT"  O  268-  75-

SETUP> b

//  /u1/inst__565_ff_d_1__13 (269)  LA
//      "S"    I  14-
//      "R"    I  145-
//      SCLK   I  4-/clk
//      D      I  265-/u1/_g32/X
//      ACLK   I  2-/scan_mclk
//      SDI    I  20-/u1/inst__565_ff_d_0__dff/Q2
//      "OUT"  O  26-  27-

SETUP> b

//  /u1/inst__565_ff_d_1__13 (14)  TIE0
//      "OUT"  O  269-  268-