Tektronix TDS524A ユーザーズマニュアル

2Ć1

This subsection begins with a general description of the traits of the
TDS 520A, 524A, 540A and 544A Digitizing Oscilloscopes. Three subsections
follow, one for each of three classes of traits: 

nominal traits, warranted char-

acteristics, and typical characteristics.

The Tektronix TDS 520A, 524A, 540A and 544A Digitizing Oscilloscopes are
portable, four-channel instruments suitable for use in a variety of test and
measurement applications and systems. Key features include:

H

500 MHz maximum analog bandwidth.

H

1 Gigasample/second maximum digitizing rate (TDS 540A and 544A); 
500 Megasamples/second maximum digitizing rate (TDS 520A and
524A).

H

Four-channel acquisition — the TDS 540A and 544A offer four full-fea-
tured channels; the TDS 520A and 524A offer two full-featured channels
and two channels with limited vertical scale selections: 100 mV, 1 V, and
10 V.

H

Extensive triggering capabilities: such as edge, logic, and glitch. Video
trigger (Option 05) is also available. The video trigger modes are NTSC,
PAL, SECAM, HDTV, and FlexFormat

TM

 (user definable format).

H

Waveform Math — Invert a single waveform and add, subtract, and
multiply two waveforms. On the TDS 524A, 544A, and other TDS 500A
equipped with option 2F, integrate or differentiate a single waveform or
perform an FFT (fast fourier transform) on a waveform to display its
magnitude or phase versus its frequency.

H

Eight-bit digitizers.

H

Up to 15,000-point record length per channel (50,000-point with option
1M).

H

Full GPIB software programmability. Hardcopy output using GPIB,
RS-232, or Centronics ports (RS-232 and Centronics is standard on the
TDS 524A and 544A and optional, as option 13, on the TDS 520A and
540A).

H

Complete measurement and documentation capability.

H

Intuitive graphic icon operation blended with the familiarity of traditional
horizontal and vertical knobs.

H

On-line help at the touch of a button.

H

A full complement of advanced functions, like continuously-updated
measurements, results and local pass/fail decision making.