Intel Xeon 7130N LF80550KF0878M データシート
製品コード
LF80550KF0878M
Electrical Specifications
Dual-Core Intel
®
Xeon
®
Processor 7000 Series Datasheet
23
2.7
Test Access Port (TAP) Connection
Due to the voltage levels supported by other components in the TAP logic, Intel recommends that
the Dual-Core Intel Xeon processor 7000 series be first in the TAP chain, followed by any other
components within the system. Use of a translation buffer to connect to the rest of the chain is
recommended unless one of the other components is capable of accepting an input of the
appropriate voltage. Similar considerations must be made for TCK, TMS, TRST#, TDI, and TDO.
Two copies of each signal may be required, each driving a different voltage level.
the Dual-Core Intel Xeon processor 7000 series be first in the TAP chain, followed by any other
components within the system. Use of a translation buffer to connect to the rest of the chain is
recommended unless one of the other components is capable of accepting an input of the
appropriate voltage. Similar considerations must be made for TCK, TMS, TRST#, TDI, and TDO.
Two copies of each signal may be required, each driving a different voltage level.
2.8
Absolute Maximum and Minimum Ratings
specifies absolute maximum and minimum ratings. Within functional operation limits,
functionality and long-term reliability can be expected.
At conditions outside functional operation condition limits, but within absolute maximum and
minimum ratings, neither functionality nor long-term reliability can be expected. If a device is
returned to conditions within functional operation limits after having been subjected to conditions
outside these limits, but within the absolute maximum and minimum ratings, the device may be
functional, but with its lifetime degraded depending on exposure to conditions exceeding the
functional operation condition limits.
minimum ratings, neither functionality nor long-term reliability can be expected. If a device is
returned to conditions within functional operation limits after having been subjected to conditions
outside these limits, but within the absolute maximum and minimum ratings, the device may be
functional, but with its lifetime degraded depending on exposure to conditions exceeding the
functional operation condition limits.
At conditions exceeding absolute maximum and minimum ratings, neither functionality nor
long-term reliability can be expected. Moreover, if a device is subjected to these conditions for any
length of time then, when returned to conditions within the functional operating condition limits, it
will either not function, or its reliability will be severely degraded.
long-term reliability can be expected. Moreover, if a device is subjected to these conditions for any
length of time then, when returned to conditions within the functional operating condition limits, it
will either not function, or its reliability will be severely degraded.
Although the processor contains protective circuitry to resist damage from static electric discharge,
precautions should always be taken to avoid high static voltages or electric fields.
precautions should always be taken to avoid high static voltages or electric fields.
Table 2-7. Processor Absolute Maximum Ratings
Symbol
Parameter
Min
Max
Unit
Notes
1, 2
NOTES:
1. For functional operation, all processor electrical, signal quality, mechanical, and thermal specifications must
1. For functional operation, all processor electrical, signal quality, mechanical, and thermal specifications must
be satisfied.
2. Overshoot and undershoot voltage guidelines for input, output, and I/O signals are outlined in
Excessive overshoot or undershoot on any signal will likely result in permanent damage to the processor.
V
CC
Processor core supply voltage with
respect to V
respect to V
SS
–0.3
1.55
V
V
TT
Front side bus termination voltage with
respect to V
respect to V
SS
–0.3
1.55
V
T
CASE
Processor case temperature
See
°C
T
STORAGE
Processor storage temperature
–40
85
°C
3,
4
3. Storage temperature is applicable to storage conditions only. In this scenario, the processor must not receive
a clock, and no pins can be connected to a voltage bias. Storage within these limits will not affect the long-term
reliability of the device. For functional operation, please refer to the processor case temperature
specifications.
reliability of the device. For functional operation, please refer to the processor case temperature
specifications.
4. This rating applies to the processor and does not include any packaging or trays.