Intel D525 AU80610006225AA ユーザーズマニュアル
製品コード
AU80610006225AA
Datasheet
79
Testability
10
Testability
In Intel Atom Processor D400 and D500 Series, testability for Automated Test
Equipment (ATE) board level testing has been implemented as JTAG boundary scan.
Equipment (ATE) board level testing has been implemented as JTAG boundary scan.
10.1
JTAG Boundary Scan
The Intel Atom Processor D400 and D500 Series add Boundary Scan ability compatible
with the IEEE 1149.1-2001 Standard (Teset Access Port and Boundary-Scan
Architecture) specification.
with the IEEE 1149.1-2001 Standard (Teset Access Port and Boundary-Scan
Architecture) specification.
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