Mentor fastscan and flextest v8.6_4 ユーザーズマニュアル
FastScan and FlexTest Reference Manual, V8.6_4
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Report Testability Data
Command Dictionary
Report Testability Data
Tools Supported: FastScan and FlexTest
FastScan Scope: Atpg, Fault, and Good modes
FlexTest Scope: Atpg and Fault modes
Usage
REPort TEstability Data -Class class_type [filename] [-Replace]
Description
Analyzes collapsed faults for the specified fault class and displays the analysis.
The Report Testability Data command identifies and displays any circuitry
connections that may cause test coverage problems for the specified fault classes.
The display may include any of the following connection types:
connections that may cause test coverage problems for the specified fault classes.
The display may include any of the following connection types:
•
Tied or blocked by constraints
•
Connected with clock lines
•
Tie-x gates
•
Tri-state-driver enable lines
•
Non-scan latches
•
Non-observable scan latches
•
RAM gates
•
Unresolved wired-gates
•
Primary outputs that connect to clocks
In addition to the above connection types, FlexTest may include the following:
•
Tied latches
•
ROM gates