Mentor v8.6_4 사용자 설명서

FastScan and FlexTest Reference Manual, V8.6_4

The type of procedures may include shift procedure, load and unload procedure,
shadow-control procedure, master-observe procedure, shadow-observe procedure,
and skew-load procedure. The list of events may be any combination of the
following commands:

FORCE “primary_input_pin” <value> <time>;

This command is used to force a value (0,1, X, or Z) on a selected primary input
pin at a given time. The time values must not be lower than previous time values
for that procedure. The time for each procedure begins again at time 0. The
primary input pin will be enclosed in double quotes.

APPLY “scan_group_procedure_name” <#times> <time>;

This command indicates the selected procedure name is to be applied the selected
number of times beginning at the selected time. The scan group procedure name
will be enclosed in double quotes. This command may only be used inside the
load and unload procedures.

FORCE_SCI “scan_chain_name” <time>;

This command indicates the time in the shift procedure that values are to be
placed on the scan chain inputs. The scan chain name will be enclosed in double
quotes.

MEASURE_SCO “scan_chain_name” <time>;

This command indicates the time in the shift procedure that values are to be
measured on the scan chain outputs. The scan chain name will be enclosed in
double quotes.

The functional_chain_test section contains a definition of a functional scan chain
test for all scan chains in the circuit to be tested. For each scan chain group, the
scan chain test will include a load of alternating double zeros and double ones
(00110011...) followed by an unload of those values for all scan chains of the
group. The format is as follows: