Hitachi 100GB 7200 RPM HTE721010G9SA00 Benutzerhandbuch

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Travelstar E7K100 (SATA) Hard Disk Drive Specification
152 
data collection activities which is initiated by the S.M.A.R.T. Execute Off-line Immediate (Subcommand D4h) 
even if the automatic off-line feature is disabled.
Any other non-zero value written by the host into this register before issuing this subcommand is vendor specific 
and will not change the current Automatic Off-Line Data Collection and Off-line Read Scanning status. However, 
the device may respond with the error code specified in Table 112:  “S.M.A.R.T. Error Codes” on page 163.
12.40.2  Device Attribute Data Structure
The following defines the 512 bytes that make up the Attribute Value information. This data structure is accessed 
by the host in its entirety using the S.M.A.R.T. Read Attribute Values subcommand. All multibyte fields shown in 
these data structures follow the ATA/ATAPI-6 specification for byte ordering, namely, that the least significant byte 
occupies the lowest numbered byte address location in the field.
Table 102: Device Attribute Data Structure
(*1) – See following definitions
(*2) – This value varies due to actual operating condition.
(*3) – Filled with 00h.
12.40.2.1  Data Structure Revision Number
The Data Structure Revision Number identifies which version of this data structure is implemented by the device. 
This revision number will be set to 0005h. This revision number identifies both the Attribute Value and Attribute 
Threshold Data structures.
Description
Byte
Offset
Format
Value
Data Structure Revision Number
2
00h
binary
0010h
1st Device Attribute
12
02h
(*1)
(*2)
 ...       
30th Device Attribute
12
15Eh
(*1)
(*2)
Off-line data collection status
1
16Ah
(*1)
(*2)
Self-test execution status
1
16Bh
(*1)
(*2)
Total time in seconds to complete off-line data 
collection activity
2
16Ch
(*1)
(*2)
Current segment pointer
1
16Eh
(*1)
(*2)
Off-line data collection capability
1
16Fh
(*1)
1Bh
S.M.A.R.T. capability
2
170h
(*1)
0003h
S.M.A.R.T. device error logging capability
1
172h
(*1)
01h
Self-test failure check point
1
173h
(*1)
(*2)
Short self-test completion time in minutes
1
174h
(*1)
(*2)
Extended self-test completion time in minutes
1
175h
(*1)
(*2)
Reserved
12
176h
(*3)
Vendor specific
125
182h
(*3)
Data structure checksum
1
1FFh
(*1)
(*2)
512