Crucial Micron C400 512GB MTFDDAK512MAM-1K12 Benutzerhandbuch
Produktcode
MTFDDAK512MAM-1K12
Reliability
Micron’s SSDs incorporate advanced technology for defect and error management.
They use various combinations of hardware-based error correction algorithms and
firmware-based static and dynamic wear-leveling algorithms.
They use various combinations of hardware-based error correction algorithms and
firmware-based static and dynamic wear-leveling algorithms.
Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
Table 6: Uncorrectable Bit Error Rate
Uncorrectable Bit Error Rate
Operation
<1 sector per 10
15
bits read
READ
Mean Time To Failure
Mean time to failure (MTTF) for the SSD can be predicted based on the component reli-
ability data using the methods referenced in the Telcordia SR-332 reliability prediction
procedures for electronic equipment.
ability data using the methods referenced in the Telcordia SR-332 reliability prediction
procedures for electronic equipment.
Table 7: MTTF
Density
128GB
1.2 million
256GB
1.2 million
512GB
1.2 million
Note: 1. The product achieves a mean time to failure (MTTF) of 1.2 million hours, based on popu-
lation statistics not relevant to individual units.
Endurance
Endurance for the SSD can be predicted based on the usage conditions applied to the
device, the internal NAND component cycles, the write amplification factor, and the
wear-leveling efficiency of the drive. The table below shows the drive lifetime for each
SSD density based on predefined usage conditions.
device, the internal NAND component cycles, the write amplification factor, and the
wear-leveling efficiency of the drive. The table below shows the drive lifetime for each
SSD density based on predefined usage conditions.
Table 8: Drive Lifetime
Density
Drive Lifetime (Total Bytes Written)
128GB
72TB
256GB
72TB
512GB
72TB
Notes: 1. Total bytes written calculated with the drive 90% full.
2. Access patterns are 50% sequential and 50% random and consist of the following: 5%
are 4k; 5% are 8k; 10% are 16k; 10% are 32k; 35% are 64K; and 35% are 128k.
3. GB/day can be calculated by dividing the total bytes written value by (365 × number of
years). For example: 72TB/5 years/365 days = 40 GB/day for 5 years.
C400 2.5-Inch NAND Flash Self-Encrypting Drive SSD
Reliability
PDF: 09005aef848722e9
realssd_c400_2_5_sed.pdf - Rev. A 09/11 EN
realssd_c400_2_5_sed.pdf - Rev. A 09/11 EN
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