Crucial Micron P300 100GB SATA MTFDDAC100SAL-1N1AA Benutzerhandbuch
Produktcode
MTFDDAC100SAL-1N1AA
Reliability
Micron SSDs incorporate advanced technology for defect and error management. Mi-
cron uses various combinations of hardware-based error correction algorithms and
firmware-based static and dynamic wear-leveling algorithms.
cron uses various combinations of hardware-based error correction algorithms and
firmware-based static and dynamic wear-leveling algorithms.
Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
Table 8: Uncorrectable Bit Error Rate
Uncorrectable Bit Error Rate
Operation
<1 sector per 10
16
bits read
READ
Mean Time Between Failures
Mean time between failures (MTBFs) for the SSD can be predicted based on the compo-
nent reliability data using the methods referenced in the Telcordia SR-332 reliability
prediction procedures for electronic equipment.
nent reliability data using the methods referenced in the Telcordia SR-332 reliability
prediction procedures for electronic equipment.
Table 9: MTBFs
Density
MTBF (Operating Hours)
50GB
2 million
100GB
2 million
200GB
2 million
Note: 1. The product achieves a mean time between failure (MTBF) of 2 million hours, based on
population statistics not relevant to individual units.
Endurance
Endurance for the SSD can be predicted based on the usage conditons applied to the
device, the internal NAND component cycles, the write amplification factor, and the
wear-leveling efficency of the drive. The table below shows the drive lifetime for each
SSD density based on predefined usage conditions.
device, the internal NAND component cycles, the write amplification factor, and the
wear-leveling efficency of the drive. The table below shows the drive lifetime for each
SSD density based on predefined usage conditions.
Table 10: Drive Lifetime
Density
Drive Lifetime (Total Bytes Written)
50GB
.875PB
100GB
1.75PB
200GB
3.5PB
Notes: 1. Total bytes written calculated with the drive 100% full.
2. Access patterns are 50% sequential and 50% random. Random accesses: 10% are 512B;
50% are 4K; 15% are 32K; 15% are 64K; and 10% are 128K. Sequential accesses: 100%
are 128K.
are 128K.
P300 2.5-Inch NAND Flash SSD
Reliability
PDF: 09005aef840793dc
p300_2_5.pdf - Rev. K 5/12 EN
p300_2_5.pdf - Rev. K 5/12 EN
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