Crucial Micron P400m 100GB MTFDDAK100MAN-1S1AA Benutzerhandbuch
Produktcode
MTFDDAK100MAN-1S1AA
Performance
Measured performance can vary for a number of reasons. The major factors affecting
drive performance are the density of the drive and the interface of the host. Additional-
ly, overall system performance can affect the measured drive performance. When com-
paring drives, it is recommended that all system variables are the same, and only the
drive being tested varies.
drive performance are the density of the drive and the interface of the host. Additional-
ly, overall system performance can affect the measured drive performance. When com-
paring drives, it is recommended that all system variables are the same, and only the
drive being tested varies.
Performance numbers will vary depending on the host system configuration.
Table 7: Drive Performance
Density
100GB
200GB
400GB
Unit
Sequential read (64KB transfer)
380
380
380
MB/s
Sequential write (64KB transfer)
200
310
310
MB/s
Random read (4KB transfer)
52,000
54,000
60,000
IOPS
Random write (4KB transfer)
21,000
26,000
26,000
IOPS
READ latency (TYP)
0.57
0.51
0.51
ms
WRITE latency (TYP)
2
2
2
ms
Notes: 1. Typical I/O performance numbers as measured using Iometer with a queue depth of 32
and write cache disabled.
2. Iometer measurements are performed in the steady state region.
3. 4KB transfers used for READ/WRITE latency values.
4. System variations may affect measured results.
3. 4KB transfers used for READ/WRITE latency values.
4. System variations may affect measured results.
Reliability
Micron’s SSDs incorporate advanced technology for defect and error management.
They use various combinations of hardware-based error correction algorithms and
firmware-based static and dynamic wear-leveling algorithms.
They use various combinations of hardware-based error correction algorithms and
firmware-based static and dynamic wear-leveling algorithms.
Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
Table 8: Uncorrectable Bit Error Rate
Uncorrectable Bit Error Rate
Operation
<1 sector per 10
16
bits
READ
Mean Time to Failure
Mean time to failure (MTTF) for the SSD can be predicted based on the component reli-
ability data using the methods referenced in the Telcordia SR-332 reliability prediction
procedures for electronic equipment.
ability data using the methods referenced in the Telcordia SR-332 reliability prediction
procedures for electronic equipment.
Table 9: MTTF
Density
100GB
2 million
P400m 2.5-Inch NAND Flash SSD
Performance
PDF: 09005aef84952553
p400m_2_5.pdf - Rev. G 5/13 EN
p400m_2_5.pdf - Rev. G 5/13 EN
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2011 Micron Technology, Inc. All rights reserved.