Crucial Micron M500DC 120GB 2.5" MTFDDAK120MBB1AE1ZAB Benutzerhandbuch
Produktcode
MTFDDAK120MBB1AE1ZAB
Performance
Measured performance can vary for a number of reasons. The major factors affecting
drive performance are the density of the drive and the interface of the host. Additional-
ly, overall system performance can affect the measured drive performance. When com-
paring drives, it is recommended that all system variables are the same, and only the
drive being tested varies.
drive performance are the density of the drive and the interface of the host. Additional-
ly, overall system performance can affect the measured drive performance. When com-
paring drives, it is recommended that all system variables are the same, and only the
drive being tested varies.
Performance numbers will vary depending on the host system configuration.
Table 7: Drive Performance
Density
120GB
240GB
480GB
800GB
Unit
Sequential read (128KB
transfer)
transfer)
425
425
425
425
MB/s
Sequential write (128KB
transfer)
transfer)
200
330
375
375
MB/s
Random read (4KB transfer)
63,000
63,000
63,000
65,000
IOPS
Random write (4KB transfer)
23,000
33,000
35,000
24,000
IOPS
READ latency (TYP)
0.50
0.50
0.50
0.50
ms
WRITE latency (TYP)
1.5
1.5
1.5
1.5
ms
Notes: 1. Typical I/O performance numbers as measured using Iometer with a queue depth of 32
and write cache disabled.
2. Iometer measurements are performed in the steady state region.
3. 4KB transfers used for READ/WRITE latency values.
4. System variations may affect measured results.
3. 4KB transfers used for READ/WRITE latency values.
4. System variations may affect measured results.
Reliability
Micron’s SSDs incorporate advanced technology for defect and error management.
They use various combinations of hardware-based error correction algorithms and
firmware-based static and dynamic wear-leveling algorithms.
They use various combinations of hardware-based error correction algorithms and
firmware-based static and dynamic wear-leveling algorithms.
Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
Table 8: Uncorrectable Bit Error Rate
Uncorrectable Bit Error Rate
Operation
<1 sector per 10
15
bits
READ
M500DC 2.5-Inch NAND Flash SSD
Performance
PDF: 09005aef854b6757
M500DC_2_5_disti.pdf - Rev. D 4/14 EN
M500DC_2_5_disti.pdf - Rev. D 4/14 EN
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2013 Micron Technology, Inc. All rights reserved.