Texas Instruments LM3434 Evaluation Board LM3434SQ-20AEV/NOPB LM3434SQ-20AEV/NOPB Datenbogen
Produktcode
LM3434SQ-20AEV/NOPB
SNVS619B – MARCH 2010 – REVISED MAY 2013
ELECTRICAL CHARACTERISTICS
Specifications in standard type face are for T
J
= 25°C and those with boldface type apply over the full Operating
Temperature Range ( T
J
=
−
40°C to +125°C). Minimum and Maximum limits are specified through test, design, or statistical
correlation. Typical values represent the most likely parametric norm at T
J
= +25ºC, and are provided for reference purposes
only. Unless otherwise stated the following conditions apply: V
EE
= -12.0V and V
IN
= +3.3V with respect to CGND.
Symbol
Parameter
Conditions
Min
(1)
Typ
(2)
Max
(1)
Units
SUPPLY CURRENT
I
IN
V
EE
V
EE
Quiescent Current
EN = CGND
142
250
µA
EN = V
IN
, Not Switching
1.0
mA
I
IN
V
IN
V
IN
Quiescent Current
EN = V
IN
, Not Switching
450
µA
EN = CGND
35
71
OUTPUT CURRENT CONTROL
V
CS
Current sense target voltage; V
CS
= V
CSP
–
V
ADJ
= V
IN
57
60
63
mV
V
CSN
G
ADJ
I
ADJ
Gain = (V
ADJ
-CGND)/(V
CNP
-V
CSN
)
V
IN
= 3.3V, V
ADJ
= 0.5V or 1.5V
15
16.67
18
V/V
w.r.t. CGND
I
CSN
Isense Input Current
V
ADJ
= 1V w.r.t. CGND
-50
µA
V
ADJ
= V
IN
10
I
CSP
Isense Input Current
V
ADJ
= V
IN
60
µA
V
ADJ
= 1V w.r.t. CGND
1
Gm
CS to COMP Transconductance;
0.6
1.3
2.2
mS
Gm = I
COMP
/ (V
CSP
– V
CSN
- V
ADJ
/16.67)
ON TIME CONTROL
T
ONTH
On time threshold
V
T
ON
- V
EE
at terminate ON time
230
287
334
mV
event
GATE DRIVE AND INTERNAL REGULATOR
V
CCOUT
V
CC
output regulation w.r.t. V
EE
I
CC
= 0mA to 20mA
6.3
6.75
7.1
V
V
CCILIM
V
CC
current limit
V
CC
= V
EE
-110
mA
R
OLH
HO output low resistance
I = 50mA source
2
Ω
R
OHH
HO output high resistance
I = 50mA sink
3
R
OLL
LO output low resistance
I = 50mA source
2
Ω
R
OHL
LO output high resistance
I = 50mA sink
3
R
OLP
DIMO output low resistance
I = 5mA source
20
Ω
R
OHP
DIMO output high resistance
I = 5mA sink
30
FUNCTIONAL CONTROL
V
INUVLO
V
IN
undervoltage lockout
With respect to CGND
1.4
V
V
CCUVLO
V
CC
- V
EE
undervoltage lockout thresholds
On Threshold
6.0
6.6
7.0
V
Off threshold
4.9
5.4
5.8
V
EN
Enable threshold, with respect to CGND
Device on w.r.t. CGND
1.6
V
Device off w.r.t. CGND
0.6
R
EN
Enable pin pullup resistor
100
k
Ω
V
DIM
DIM logic input threshold
DIM rising threshold w.r.t. CGND
1.6
V
DIM falling threshold w.r.t. CGND
0.6
R
DIM
DIM pin pulldown resistor
100
k
Ω
I
ADJ
ADJ pin current
-1.0
1.0
µA
I
SS
SS pin source current
10
µA
R
SS
SS pin pulldown resistance
EN = CGND
1.0
k
Ω
(1)
All limits specified at room temperature (standard typeface) and at temperature extremes (bold typeface). All room temperature limits are
100% production tested. All limits at temperature extremes are ensured via correlation using standard Statistical Quality Control (SQC)
methods. All limits are used to calculate Average Outgoing Quality Level (AOQL).
100% production tested. All limits at temperature extremes are ensured via correlation using standard Statistical Quality Control (SQC)
methods. All limits are used to calculate Average Outgoing Quality Level (AOQL).
(2)
Typical numbers are at 25°C and represent the most likely norm.
Copyright © 2010–2013, Texas Instruments Incorporated
5
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