Texas Instruments ESD-EVM-001 Evaluation Module ESD-EVM-001 ESD-EVM-001 Datenbogen
Produktcode
ESD-EVM-001
Table 2. Waveform Parameters in Contact Discharge Mode
(1)
Simulator
Rise Time ±25%
Current at 30ns ±30%
Current at 60ns ±30%
Stress Level
Ipeak ±15% [A]
Voltage [kV]
[nS]
[A]
[A]
1
2
7.5
0.8
4
2
2
4
15
0.8
8
4
3
6
22.5
0.8
12
6
4
8
30
0.8
16
8
(1)
Contact and air discharge are different test methods and test severity is not equivalent between contact and air discharge
methods.
methods.
TEST METHOD AND SET-UP
An example test setup is shown in figure 4. Details of the testing table and ground planes can be found in
IEC 61000-4-2 test procedure. Ground the ESD EVM using the banana connector J1. Discharge the ESD
simulator on the vias on one side of the EVM; clamping voltage can be measured using the vias on the
other side of the EVM with an oscilloscope. Contact and air-gap discharge are tested using the same
simulator with the same discharge waveform. While the simulator is in direct contact with the DUT during
contact, it is not during air-gap.
IEC 61000-4-2 test procedure. Ground the ESD EVM using the banana connector J1. Discharge the ESD
simulator on the vias on one side of the EVM; clamping voltage can be measured using the vias on the
other side of the EVM with an oscilloscope. Contact and air-gap discharge are tested using the same
simulator with the same discharge waveform. While the simulator is in direct contact with the DUT during
contact, it is not during air-gap.
Figure 4. System Level ESD Test Setup
EVALUATION OF TEST RESULTS
Connect the devices on the EVM to a curve tracer both before and after ESD testing. After testing, if the
IV curve of the ESD protection diodes shifts ±1V or leakage current increases by a factor of ten, then it is
most likely that the device is permanently damaged by ESD.
IV curve of the ESD protection diodes shifts ±1V or leakage current increases by a factor of ten, then it is
most likely that the device is permanently damaged by ESD.
4
ESD Protection Diodes EVM
SLVU702 – March 2012
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