Texas Instruments CC2530ZDK-ZLL Datenbogen
SWRS081B
–
APRIL 2009
–
REVISED FEBRUARY 2011
OP-AMP CHARACTERISTICS
T
A
= 25
°
C, VDD = 3 V . All measurement results are obtained using the CC2530 reference designs post-calibration.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Chopping Configuration, Register APCFG = 0x07, OPAMPMC = 0x03, OPAMPC = 0x01
Output maximum voltage
VDD
–
0.07
V
Output minimum voltage
0.07
V
Open-loop gain
108
dB
Gain-bandwidth product
2
MHz
Slew rate
107
V/
μ
s
Input maximum voltage
VDD + 0.13
V
Intput minimum voltage
–
55
mV
Input offset voltage
40
μ
V
CMRR
Common-mode rejection ratio
90
dB
Supply current
0.4
mA
f = 0.01 Hz to 1 Hz
1.1
Input noise voltage
nV/
√
(Hz)
f = 0.1 Hz to 10 Hz
1.7
Non-Chopping Configuration, Register APCFG = 0x07, OPAMPMC = 0x00, OPAMPC = 0x01
Output maximum voltage
VDD
–
0.07
V
Output minimum voltage
0.07
V
Open-loop gain
108
dB
Gain-bandwidth product
2
MHz
Slew rate
107
V/
μ
s
Input maximum voltage
VDD + 0.13
V
Intput minimum voltage
–
55
mV
Input offset voltage
0.8
mV
CMRR
Common-mode rejection ratio
90
dB
Supply current
0.4
mA
f = 0.01 Hz to 1 Hz
60
Input noise voltage
nV/
√
(Hz)
f = 0.1 Hz to 10 Hz
65
COMPARATOR CHARACTERISTICS
T
A
= 25
°
C, VDD = 3 V. All measurement results are obtained using the CC2530 reference designs, post-calibration.
PARAMETER
TEST CONDITIONS
MIN
TYP MAX
UNIT
Common-mode maximum voltage
VDD
V
Common-mode minimum voltage
–
0.3
Input offset voltage
1
mV
Offset vs temperature
16
µ
V/
°
C
Offset vs operating voltage
4
mV/V
Supply current
230
nA
Hysteresis
0.15
mV
10
©
2009
–
2011, Texas Instruments Incorporated
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