Texas Instruments LDC1000EVM - Evaluation Module for Inductance to Digital Converter with Sample PCB Coil LDC1000EVM LDC1000EVM Datenbogen
Produktcode
LDC1000EVM
MCU
LDO
LDC1000
5V
5V
DGND
DGND
AGND
Sensor
V
IO
DGND
V
IO
V
DD
V
IO
CLDO
SDI
SDO
SCLK
CSB
INTB
TBCLK
DGND
MOSI
MISO
SCLK
GPIO
INT/GPIO
Timer/Aux CLK
DAP
GND
CFB
CFA
INB
INA
4-Wire
Serial
Interface
INA
INB
SCLK
SDI
SDO
CS
INTB
VDD
CFA
CFB
Power
GND
VIO
DGND
CLDO
R
s
L
C
Frequency Counter
TBCLK/XIN
XOUT
Threshold
Detector
Frequency
Counter Data
Register
Proximity Data
Register
LDC
SNOSCX2 – SEPTEMBER 2013
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
BLOCK DIAGRAM
Figure 2. LDC1000 Block Diagram
TYPICAL APPLICATION SCHEMATIC
Figure 3. Typical Application Schematic
2
Copyright © 2013, Texas Instruments Incorporated
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