Texas Instruments 1.6 V, LLP-6, Temperature Switch and Temperature Sensor Evaluation Board LM26LVEB/NOPB LM26LVEB/NOPB Datenbogen
Produktcode
LM26LVEB/NOPB
LM26LV
TRIP TEST
2
GND
3
OVERTEMP
5
OVERTEMP
V
DD
4
1
NC
6
RESET
Momentary
100k
LM26LV
TRIP TEST
2
GND
5
OVERTEMP
3
OVERTEMP
V
DD
4
1
100k
NC
6
R1
4.1V
R3
R2
0.1
P
F
U3
LM4040
R4
V
OUT
V+
V
T
V
TEMP
+
-
U1
LM26LV
V
DD
U2
(High = overtemp alarm)
V
T1
V
T2
V
TEMP
V
OUT
V
T1
=
R1 + R2||R3
(4.1)R2
V
T2
=
R2 + R1||R3
(4.1)R2
SNIS144F – JULY 2007 – REVISED FEBRUARY 2013
Figure 26. Celsius Temperature Switch
Figure 27. TRIP TEST Digital Output Test Circuit
Figure 28. Latch Circuit using OVERTEMP Output
The TRIP TEST pin, normally used to check the operation of the OVERTEMP and OVERTEMP pins, may be
used to latch the outputs whenever the temperature exceeds the programmed limit and causes the digital outputs
to assert. As shown in
used to latch the outputs whenever the temperature exceeds the programmed limit and causes the digital outputs
to assert. As shown in
, when OVERTEMP goes high the TRIP TEST input is also pulled high and
causes OVERTEMP output to latch high and the OVERTEMP output to latch low. The latch can be released by
either momentarily pulling the TRIP TEST pin low (GND), or by toggling the power supply to the device. The
resistor limits the current out of the OVERTEMP output pin.
either momentarily pulling the TRIP TEST pin low (GND), or by toggling the power supply to the device. The
resistor limits the current out of the OVERTEMP output pin.
22
Copyright © 2007–2013, Texas Instruments Incorporated
Product Folder Links: