Texas Instruments IC MCU 16B MSP430F2417TPM LQFP-64 TID MSP430F2417TPM Datenbogen
Produktcode
MSP430F2417TPM
TDI
TDO
TMS
TCK
Test
JTAG
and
Emulation
Module
Burn and Test
Fuse
Controlled by JTAG
Controlled by JT AG
Controlled
by JTAG
by JTAG
DV
CC
DV
CC
DV
CC
During Programming Activity and
During Blowing of the Fuse, Pin
TDO/TDI Is Used to Apply the Test
Input Data for JTAG Circuitry
During Blowing of the Fuse, Pin
TDO/TDI Is Used to Apply the Test
Input Data for JTAG Circuitry
TDO/TDI
TDI/TCLK
TMS
TCK
Fuse
DV
CC
MSP430F261x
MSP430F241x
MSP430F241x
SLAS541K – JUNE 2007 – REVISED NOVEMBER 2012
JTAG Pins: TMS, TCK, TDI/TCLK, TDO/TDI, Input/Output With Schmitt Trigger
88
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