Freescale Semiconductor Demonstration Board for Freescale MC9S08SE8 DEMO9S08EL32AUTO DEMO9S08EL32AUTO Datenbogen

Freescale Semiconductor

353

 

Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the 
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external 
components as well as MCU software operation all play a significant role in EMC performance. The 
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263, 
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.

Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell 
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed 
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test 
software. The radiated emissions from the microcontroller are measured in a TEM cell in two package 
orientations (North and East). 

The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal 
to the reported emissions levels.

10

C

EEPROM Program/erase endurance

3

T

L

 to T

H

 = –40

°C to + 0°C

T

L

 to T

H

 = 0

°C to + 125°C

T = 25

°C

n

EEPE

10,000
50,000

100,000

—
—
—

cycles

11

C

Data retention

4

t

D_ret

15

100

—

years

1

The frequency of this clock is controlled by a software setting.

2

These values are hardware state machine controlled. User code does not need to count cycles. This information supplied for 
calculating approximate time to program and erase.

3

Typical endurance for Flash is based upon the intrinsic bit cell performance. For additional information on how Freescale 
defines typical endurance, please refer to Engineering Bulletin EB619/D, Typical Endurance for Nonvolatile Memory.

4

Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated 
to 25

°C using the Arrhenius equation. For additional information on how Freescale Semiconductor defines typical data 

retention, please refer to Engineering Bulletin EB618/D, Typical Data Retention for Nonvolatile Memory.

Radiated emissions,
electric field

V

RE_TEM

V

DD

 = 5.0V 

T

A 

= +25

o

C

package type

28 TSSOP

0.15 – 50 MHz

4MHz crystal

20MHz bus

11

dB

μV

50 – 150 MHz

12

150 – 500 MHz

3

500 – 1000 MHz

−10

IEC Level

N/A

—

SAE Level

2

—