Hitachi Microscope & Magnifier S-4800 Benutzerhandbuch

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select a number from the pull-down menu, click on the up and down button (0.1 step), or key 
in a number (0.5 to 2.0) followed by the Return key.     
Note that the optical axis and astigmatism may change when Focus Depth value is changed.   
NOTICE:  Because the primary beam is more sensitive to stray magnetic field as the Focus 
Depth increases, large values of the Focus Depth may cause image disturbance due to stray 
magnetic field in high magnification observations.     
 
(5) Specimen Bias Voltage 
Normally, it is set to OFF (uncheck the box).    Select ON (check the box) when non-uniformity 
of brightness appears on the CRT at low magnifications in high mag. mode under the 
conditions where the sample is tilted at high angles of 40 degrees or higher. Additionally select 
on especially when observing at high accelerating voltage such as 10 kV or higher.    When 
the specimen bias voltage is on, -15 V is applied to the sample. 
 
NOTES
1.  When the Specimen Bias Voltage is turned on at low accelerating voltages, SEM 
image may become dark because the detection efficiency of the SE signal is 
decreased.    We suggest that you set the Specimen Bias Voltage at OFF in order 
to correct this problem.    To improve the non-uniformity of brightness in the 
image which may appear at high sample tilt condition, at low magnifications and 
at low accelerating voltages, it is recommended to use the Low mag. mode. 
2.  Turning Specimen Bias Voltage ON and OFF may cause changes in the contrast 
of the image depending on the application. 
3.  Turning Specimen Bias Voltage ON and OFF may cause changes and require 
adjustment of the focus, astigmatism and aperture alignment. 
4. If 
the 
ABCC Link check box in the Column Tab has been checked, ABCC will 
start automatically when Specimen Bias Voltage is changed.     
Image brightness will be adjusted to adequate value. 
(6) Magnet Sample 
Astigmatism correction range is enlarged.    Use it for observation of ferromagnetic specimens 
such as iron that make astigmatism correction difficult. 
 
     CAUTION 
Pulverized ferromagnetic specimens should not be introduced into 
the specimen chamber.    If particles from such a material are 
attracted to the objective lens due to its strong magnetic field, the 
microscope performance may be degraded.     
Because ferromagnetic samples strongly interact with the magnetic 
field of the objective lens, they should be attached firmly to the 
specimen stub. 
 
NOTICE: 
If a ferromagnetic sample is large in volume, Magnetic Sample mode may fail to 
achieve complete astigmatism corrections, or may not provide an adequate