Avaya 03-300430 User Manual

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Communication Manager Maintenance-Object Repair Procedures
1042 Maintenance Procedures for Avaya Communication Manager 3.0, Media Gateways and Servers
 
One-Way Span Test (#1214)
This test is destructive.
The One-Way Span test allows 1-way span testing to and from remote test equipment or 
another Communication Manager solution. This tests all circuitry and facilities from the local 
TN767E DS1 board to the remote test equipment or other Communication Manager solution.
The test is destructive and can only be initiated by a technician-demanded test ds1-loop 
location one-way-span-test-begin
.
Use busyout board to busy out all trunks or ports on the DS1 Interface circuit pack before 
running the One-Way Span test.
The One-Way Span test has the TN767E DS1 Interface circuit pack transmit a framed 3-in-24 
test pattern and attempts to receive and verify the pattern. If the TN767E board receives a 
framed 3-in-24 test pattern sent from another Communication Manager system or test 
equipment at the far end of the DS1, it begins counting bit errors within the received pattern.
Note:
Note:
G700
: When a TN464 and an MM710 are connected, the One-Way Span test 
does not frame-align to the 3-in-24 repetitive pattern, and the test fails. 
The status of the One-Way Span test appears in the hardware error log via Error Type #3902. 
Several aux values give information on the status of the test.
Use list measurements ds1 summary to see the length of time the test has been running 
(Test Duration field) and number of bit errors detected (Loopback/Span Test 
Bit-Error Count field). If the test pattern is sent cleanly over the span from the far end, the 
number of bit errors should be very low. The Test Duration field is 0 until the test pattern is 
received from the far end. Upon receiving the test pattern, the board begins calculating the test 
duration and number of bit errors. The command also shows the type of loop-back/span test 
executing (Test field), the type of pattern generated for the loop-back/span test (Pattern 
field), and whether the pattern (i.e., 3-in-24 Pattern) is synchronized (Synchronized field).
Use test ds1-loop location end-loopback/span-test or release board to end 
the test. Use release board to restore all trunks or ports on the TN767E DS1 Interface circuit 
pack to the in-service state.
Table 358: Test #1214 One-Way Span Test 
Error 
Code
Test 
Result
Description / Recommendation
ABRT
Internal system error
1. Retry test ds1-loop location one-way-span-test-begin at 
1-minute intervals up to 5 times.
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