Hynix HMP125U6EFR8C-S6 Leaflet
Rev. 0.3 / Nov. 2008 14
1
240pin DDR2 SDRAM Unbuffered DIMMs
OUTPUT BUFFER LEVELS
OUTPUT AC TEST CONDITIONS
Note:
1. The VDDQ of the device under test is referenced.
OUTPUT DC CURRENT DRIVE
Note:
1.V
DDQ
= 1.7 V; V
OUT
= 1420 mV. (V
OUT
- V
DDQ
)/I
OH
must be less than 21 ohm for values of V
OUT
between V
DDQ
and
V
DDQ
- 280 mV.
2. V
DDQ
= 1.7 V; V
OUT
= 280 mV. V
OUT
/I
OL
must be less than 21 ohm for values of V
OUT
between 0 V and 280 mV.
3. The dc value of V
REF
applied to the receiving device is set to V
TT
4. The values of I
OH
(dc) and I
OL
(dc) are based on the conditions given in Notes 1 and 2. They are used to test device
drive current capability to ensure V
IH
min plus a noise margin and V
IL
max minus a noise margin are delivered to an
SSTL_18 receiver. The actual current values are derived by shifting the desired driver operating point along a 21 ohm
load line to define a convenient driver current for measurement.
Symbol
Parameter
SSTL_18
Units
Notes
V
OTR
Output Timing Measurement Reference Level
0.5 * V
DDQ
V
1
Symbol
Parameter
SSTl_18
Units
Notes
I
OH(dc)
Output Minimum Source DC Current
- 13.4
mA
1, 3, 4
I
OL(dc)
Output Minimum Sink DC Current
13.4
mA
2, 3, 4