Lucent Technologies R5SI User Manual
DEFINITY Enterprise Communications Server Release 5
Maintenance and Test for R5vs/si
Maintenance and Test for R5vs/si
555-230-123
Issue 1
April 1997
Maintenance Object Repair Procedures
Page 10-1168
PR-MEM (TN790 RISC Memory)
10
Notes:
a. Refer to PROCR (TN790 RISC Processor) Maintenance documentation for
a description of these tests.
b. This test is run only on the Standby SPE in a High or Critical Reliability
system. On other systems or on the Active SPE, the test is run only via a
reset system 4
command or a
reset system 5
command.
c. Refer to PR-MAINT (MainTenance Processor) Maintenance
documentation for a description of these tests.
Read All Memory Test (#85)
This test is a nondestructive test. The test reads every memory location in
memory. A failure of this test indicates a DRAM failure in the Processor
circuit pack. DRAM is replaceable and installed in 3 Single Inline Memory
Module (SIMM) sockets on this circuit pack. Replacement of these SIMMs
is described in the "Circuit Pack Replacement Procedure" section.
memory. A failure of this test indicates a DRAM failure in the Processor
circuit pack. DRAM is replaceable and installed in 3 Single Inline Memory
Module (SIMM) sockets on this circuit pack. Replacement of these SIMMs
is described in the "Circuit Pack Replacement Procedure" section.
Table 10-352.
TEST #85 Read All Memory Test
Error Code
Test
Result
Description/ Recommendation
100
ABORT
The requested test did not complete within the allowable time period.
1. Retry the command.
1029 2014
2015 2016
2017 2018
2020 2022
2024 2025
2051
2015 2016
2017 2018
2020 2022
2024 2025
2051
ABORT
Refer to STBY-SPE Maintenance documentation for a description of
these error codes.
these error codes.
2500
ABORT
Internal system error
1. Retry the command.
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