Lucent Technologies R5SI User Manual
DEFINITY Enterprise Communications Server Release 5
Maintenance and Test for R5vs/si
Maintenance and Test for R5vs/si
555-230-123
Issue 1
April 1997
Maintenance Object Repair Procedures
Page 10-1171
PR-MEM (TN790 RISC Memory)
10
Memory Functional Test (#332)
This test is destructive.
This test ensures that every DRAM memory location can be accessed and
changed independently. Running this test wipes out all data in DRAM memory.
This test is performed during a
changed independently. Running this test wipes out all data in DRAM memory.
This test is performed during a
reset system 4
or
reset system 5
. If the test fails
during a
reset system
command, refer to the "Procedure for SPE-Down Mode" in
the
for the recommended maintenance
strategy. This test can be run as a long demand test on the standby SPE.
Table 10-354.
TEST #87 Memory Parity Error Detection Test
Error
Code
Code
Test
Result
Description/ Recommendation
100
ABORT
The test did not complete within the allowable time period.
1. Retry the command.
1029
2014
2015
2016
2017
2018
2020
2022
2024
2025
2051
2014
2015
2016
2017
2018
2020
2022
2024
2025
2051
ABORT
Refer to STBY-SPE Maintenance documentation for a description of these
error codes.
error codes.
2500
ABORT
Internal system error
1. Retry the command.
1 - 7
FAIL
The parity detection circuitry is not working correctly. If the system can
still provide service, this indicates that the Processor circuit pack has a
problem but can still function.
still provide service, this indicates that the Processor circuit pack has a
problem but can still function.
1. The TN790 Processor circuit pack should be replaced. The failure is
identifying the PROCR as being bad and only the PROCR circuit
pack needs to be replaced.
pack needs to be replaced.
PASS
The parity detection circuitry is working.