Nortel Networks 3500 User Manual

Operation, administration, and maintenance (OAM) features 2-165

Planning and Ordering Guide—Part 1 of 2 NTRN10AN Rel 12.1 Standard Iss 1 Apr 2004

Split test access

The split test access is an intrusive, service-affecting operation. The original
cross connection is split, with the incoming signal being connected (via TAP)
to the test unit receiver and the outgoing signal is fed from the transmitter of
test unit. See

Figure 2-57

Figure 2-57
Test access-split state

EX1398

The split test access configurations that are supported include:

•

Single Facility Access Digroup, Split Equipment side (Single FAD,
SPLTE) see

Figure 2-58

•

Single Facility Access Digroup, Split Facility side (Single FAD, SPLTF)
see

Figure 2-59

•

Single Facility Access Digroup, Split Equipment input and continue from
TAP (Single FAD, SPLTA) see

Figure 2-60

•

Dual Facility Access Digroup, Split Equipment and Facility sides (Dual
FAD, SPLTEF) see

Figure 2-61

Note: In

Figure 2-58

Figure 2-61

“equipment side” and “facility side”

shows the direction(s) of the connection under test.

Single FAD, SPLTE and Single FAD SPLTF

In a single FAD environment, only one direction of the signal can be tested at
a time.

In the case of Single FAD, SPLTE, both the A and B paths are interrupted with
the input of A path-equipment side going to the TAP input and the output to B
path-equipment side as shown in

Figure 2-58

Input

Output

Test

Unit

TAP IN

TAP Out