DELL JSM-6060LV User Manual
J E O L J S M - 6 0 6 0 L V S C A N N I N G E L E C T R O N M I C R O S C O P E
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Introduction
he JEOL JSM-6060LV is a state-of-the-art scanning electron microscope that features
a low vacuum for observation of non-conductive specimens, a fully automated electron
gun, a backscattered electron detector for atomic number contrast imaging, fully
integrated digital control, motorized x-y stage, and a NORAN System 6 elemental
a low vacuum for observation of non-conductive specimens, a fully automated electron
gun, a backscattered electron detector for atomic number contrast imaging, fully
integrated digital control, motorized x-y stage, and a NORAN System 6 elemental
analysis system (see separate operating instructions for the NORAN system). Best of all, the
JEOL JSM-6060LV scanning electron microscope is user-friendly and easy to operate.
JEOL JSM-6060LV scanning electron microscope is user-friendly and easy to operate.
Safety
The scanning electron microscope is a relatively safe instrument.. You can do much more
damage to it than it can do to you. When the electron beam is turned on, some x-rays are
produced as a result of electron beam interaction with the sample, but these x-rays are of relatively
low energy and do not escape the sample chamber. The instrument also produces some radio
frequency energy.
damage to it than it can do to you. When the electron beam is turned on, some x-rays are
produced as a result of electron beam interaction with the sample, but these x-rays are of relatively
low energy and do not escape the sample chamber. The instrument also produces some radio
frequency energy.
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