Tektronix TDS 700D User Manual
Table of Contents
ii
TDS 500D, TDS 600B & TDS 700D Performance Verification and Specifications
List of Figures
Figure 1–1: Map of display functions
1–3
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Figure 1–2: Verifying adjustments and signal-path compensation
1–6
. .
Figure 1–3: Universal test hookup for functional tests –
TDS 600B shown
1–8
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Figure 1–4: Measurement of DC offset accuracy at zero setting
1–31
. . . .
Figure 1–5: Initial test hookup
1–32
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Figure 1–6: Measurement of DC accuracy at maximum
offset and position
1–35
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Figure 1–7: Initial test hookup
1–37
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Figure 1–8: Optional initial test hookup
1–37
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Figure 1–9: Measurement of analog bandwidth
1–40
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Figure 1–10: Initial test hookup
1–42
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Figure 1–11: Measurement of channel delay – TDS 684B shown
1–44
. . . .
Figure 1–12: Initial test hookup
1–46
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Figure 1–13: Measurement of accuracy – Long-term and delay time
1–48
Figure 1–14: Initial test hookup
1–50
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Figure 1–15: Measurement of time accuracy for pulse and
glitch triggering
1–51
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Figure 1–16: Initial test hookup
1–53
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Figure 1–17: Measurement of trigger-level accuracy
1–55
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Figure 1–18: Initial test hookup
1–58
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Figure 1–19: Measurement of trigger sensitivity – 50 MHz results
shown on a TDS 684B screen
1–59
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Figure 1–20: Initial test hookup
1–62
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Figure 1–21: Measurement of main trigger out limits
1–64
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Figure 1–22: Initial test hookup
1–66
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Figure 1–23: Measurement of probe compensator frequency
1–68
. . . . . . .
Figure 1–24: Subsequent test hookup
1–69
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Figure 1–25: Measurement of probe compensator amplitude
1–70
. . . . . .
Figure 1–26: Jitter test hookup
1–72
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Figure 1–27: Jitter test displayed waveform – TDS 684B shown
1–73
. . . .
Figure 1–28: Jitter test when completed – TDS 684B shown
1–74
. . . . . . .
Figure 1–29: Triggered signal range test – 300 mV
1–75
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Figure 1–30: Triggered signal range test – 75 mV
1–76
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Figure 1–31: 60 Hz Rejection test hookup
1–77
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Figure 1–32: 60 Hz Rejection test setup signal
1–77
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