X-Rite Densitometer SpectroEye SPEUV User Manual

Colorimetry

CIE L*a*b*, CIE L*C*h (a*b*),  

ΔE* CIELAB

CIE L*a*b*, CIE L*C*h (a*b*),  

Δ E* CIELAB

CIE XYZ, CIE xyY; CIE L*u*v*, CIE L*C*h 

(u*v*), 

ΔE CIELUV;LABmg, LCHmg, ΔEmg; 

Hunter Lab, 

ΔE Hunter Lab; RxRyRz

Special color deviation formulas

optional

ΔE*2000, ΔE*94, ΔE CMC, ΔE FMCII, 

Metamerism

Densitometry

Density, All densities (Grey Balance),  

Dot gain, Dot area, Trapping, Contrast,    

Print characteristic, Auto Function

Density, All densities (Grey Balance),  

Dot gain, Dot area, Trapping, Contrast, 

Print characteristic, Auto Function

Printing plate, Greyness, Hue error

Spectrum

optional

Reflection spectrum 

Density spectrum

Special functions

optional

Best Match

Color guides

optional

PANTONE

®

 Formula Guide (coated, 

uncoated, matte) and PANTONE Goe 

libraries (coated, uncoated)

DIC Color Guide; HKS E, K, N and Z

Dye Strength

optional

optional 

Absolute (K/S) and relative (K/S)

White- and Yellowness

optional

optional 

Whiteness CIE, Whiteness ASTM E313, 

Whiteness Berger, Whiteness Stensby,, ISO

Brightness R457, Yellowness ASTM E313,

Yellowness ASTM D1925, Tint CIE

Security

optional

optional

Setting protection, Multi user

KeyWizard

included

included

NetProfiler 2

optional

Color Quality

Basic version incl., Full version optional

InkFormulation

optional

White base

Absolute, relative

Illumination types

D50, D65, A, C, D30…D300, F1…F12 

Standard observers

2°, 10° 

Density standards

ISO Status A, ISO Status E, ISO Status I, ISO Status T, DIN 16536, DIN 16536 NB,

Spectral analysis

Holographic diffraction grating

Spectral range

380nm to 730nm 

Physical resolution

10nm (internal resolution: 3.3nm)

Measurement geometry

45°/0° ring optic, DIN 5033 

Measurement aperture

4.5mm or 3.2 mm (selectable upon order)

Light source

Gas-filled tungsten, type A illumination 

Physical filters

No (incandescent lamp light), Polarized, D65 (Approximated daylight), Optional UV cutoff

Measurement time

Approximately 1.5 sec 

Measurement range

Density DIN 16536: 0.0D–2.5D

Inter-instrument agreement

Typical 0.3 

ΔE* CIELAB, or 0.15 ΔE CMC(2:1) average based on 12 BCRA tiles (D50, 2°)

Linearity

± 0.01D 

Short-term repeatability

0.02 

ΔE* CIELAB (D50, 2°), mean value of 10 measurements every 10 seconds on

Density repeatability

Density DIN 16536 (Repeatability ±0.01D):  

No Filter 0.0D–2.5D, Yellow 0.0D–2.0D 

Pol Filter 0.0D–2.2D, Yellow 0.0 D–1.8D

Filter wheel

Electronic selection of filter 

White calibration

Automatic on integrated white tile 

Instrument check

Automatic check of the spectral calibration 

Density filter recognition

Manual and automatic 

Average

Averaging for multiple measurement values 

Color detection

Manual and automatic assignment of samples to references

Serial data interface

RS232C with Baud rate: 300 to 57,600

Power supply

NiMH battery pack, nom. 7.2V, 1300 mAh 

AC adapter requirements

85 VAC to 270 VAC, 47 Hz to 63 Hz 

Charge time

Approximately 3 hours, automatic disconnection 

Charge status

Automatic capacity checking and display 

Measurements per charge

Approximately 3000 

Physical dimensions

24.5 cm length, 8.3 cm width, 8 cm height (9.6 x 3.3 x 3.2 in)

Weight

Approximately 990 g, (2.18 lb)

white

SPI

© 2008, X-Rite, Incorporated. All rights reserved. 

L7-423  (10/08)