Xerox Paris, a document system Support & Software User Guide
Chapter 7, Using Events
Using Tests
The Paris Designer User Manual
177
T
E S T C O N D I T I O N S
The test conditions for an event are set with the relevant Test Information (Test
Info).
Info).
First Line:
The first line in the text block or printstream to be tested. For example, if the first
line to be tested is Line 7, then First Line = 7.
line to be tested is Line 7, then First Line = 7.
Num Lines:
The number of lines (including the first line) to be tested. For example:
••••
If only the first line is to be tested, then Num Lines = 1.
••••
If First Line = 6 and lines 6, 7 and 8 are to be tested, then Num Lines = 3.
Offset:
The Offset is the start position in the line, of the byte or character string being
tested. An offset of 0 means the first position in the line.
tested. An offset of 0 means the first position in the line.
Len:
This option is only used in the ‘Equal To Prev’ and ‘Not Equal To Prev’ tests, to
specify the length of the area to monitor for a change. This value is ignored in all
other types of tests.
specify the length of the area to monitor for a change. This value is ignored in all
other types of tests.
Mask:
The mask can be applied to the data to convert its value. The returned value is the
‘bitwise logical and’ of the data and the mask. For example, setting the mask to a
value of 127 strips the high bit from the data.
‘bitwise logical and’ of the data and the mask. For example, setting the mask to a
value of 127 strips the high bit from the data.
NOTE
Normally you would not use any value other than 255 in this field.