Intel E5240 EU80573KJ0806M Data Sheet

Product codes
EU80573KJ0806M
Page of 114
35
Dual-Core Intel® Xeon® Processor 5200 Series Electrical Specifications
Notes:
1.
Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2.
Measured at 0.2*V
TT
.
3.
V
OH
 is determined by value of the external pullup resistor to V
TT
. Refer to platform design guide for details.
4.
For V
IN
 between 0 V and V
OH
.
2.13.2
V
CC
 Overshoot Specification
The Dual-Core Intel® Xeon® Processor 5200 Series can tolerate short transient 
overshoot events where V
CC
 exceeds the VID voltage when transitioning from a high-
to-low current load condition. This overshoot cannot exceed VID + V
OS_MAX
 (V
OS_MAX
 is 
the maximum allowable overshoot above VID). These specifications apply to the 
processor die voltage as measured across the VCC_DIE_SENSE and VSS_DIE_SENSE 
lands and across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands.
Notes:
1.
VOS is the measured overshoot voltage.
2.
TOS is the measured time duration above VID.
2.13.3
Die Voltage Validation
Core voltage (VCC) overshoot events at the processor must meet the specifications in 
 when measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands 
and across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands. Overshoot events that 
are < 10 ns in duration may be ignored. These measurements of processor die level 
overshoot should be taken with a 100 MHz bandwidth limited oscilloscope.
Table 2-17. V
CC
 Overshoot Specifications
Symbol
Parameter
Min
Max
Units
Figure
Notes
V
OS_MAX
Magnitude of V
CC
 overshoot above VID
50
mV
T
OS_MAX
Time duration of V
CC
 overshoot above VID
25
µs
Figure 2-8. V
CC
 Overshoot Example Waveform
Example Overshoot Waveform
0
5
10
15
20
25
Time [us]
Volt
age
 [V
]
VID - 0.000
VID + 0.050
V
OS
T
OS
T
OS
: Overshoot time above VID
V
OS
: Overshoot above VID