Intel QX9775 EU80574XL088N Data Sheet

30

NOTES:
1.

Unless otherwise noted, all specifications in this table apply to all processor frequencies.

2.

The V

TT

 referred to in these specifications refers to instantaneous V

TT

.

3.

Measured at 0.1*V

TT

.

4.

Measured at 0.9*V

TT

.

5.

For Vin between 0 V and V

TT

. Measured when the driver is tristated.

NOTES:
1.

Unless otherwise noted, all specifications in this table apply to all processor frequencies.

2.

Measured at 0.2*V

TT

.

3.

V

OH

 is determined by value of the external pullup resistor to V

TT

. 

4.

For V

IN

 between 0 V and V

OH

.

The processor can tolerate short transient overshoot events where V

CC

 exceeds the VID 

voltage when transitioning from a high-to-low current load condition. This overshoot 

cannot exceed VID + V

OS_MAX

 (V

OS_MAX

 is the maximum allowable overshoot above 

VID). These specifications apply to the processor die voltage as measured across the 

VCC_DIE_SENSE and VSS_DIE_SENSE lands and across the VCC_DIE_SENSE2 and 

VSS_DIE_SENSE2 lands.

V

IL

Input Low Voltage

-0.10

0.00

0.3 * V

TT

V

2,6

V

IH

Input High Voltage

0.7 * V

TT

V

TT

V

TT

 + 0.1

V

2

V

OL

Output Low Voltage

-0.10

0

0.1 * V

TT

V

2

V

OH

Output High Voltage

0.9 * V

TT

V

TT

V

TT 

+ 0.1

V

2

I

OL

Output Low Current

1.70

N/A

4.70

mA

3

I

OH

Output High Current

1.70

N/A

4.70

mA

4

I

LI

Input Leakage Current

N/A

N/A

± 100

μA

5

V

OL

Output Low Voltage

0

N/A

0.20 * V

TT

V

V

OH

Output High Voltage

0.95 * V

TT

V

TT

1.05 * V

TT

V

3

I

OL

Output Low Current

16

N/A

50

mA

2

I

LO

Leakage Current

N/A

N/A

± 200

μA

4

V

OS_MAX

Magnitude of V

CC

 overshoot above 

VID

—

50

mV

T

OS_MAX

Time duration of V

CC

 overshoot above 

VID

—

25

µs