Nokia 5110 Service Manual
PAMS
Technical Documentation
NSE–1
Disassembly & Troubleshooting Instructions
Page 7
Original 03/98
The test procedure is following:
1. Connect the short circuit wire between the test points J229 and J230.
2. Switch power on
3. If the voltage level in testpoint J225 is 2.8 V (”1”), the interface is OK. If
there is a short circuit, the voltage level in testpoint J225 stays low and
32kHz square wave signal can be seen in the lines which are al-
ready tested.
2. Switch power on
3. If the voltage level in testpoint J225 is 2.8 V (”1”), the interface is OK. If
there is a short circuit, the voltage level in testpoint J225 stays low and
32kHz square wave signal can be seen in the lines which are al-
ready tested.
One must be noticed that this test can be found only short circuits, not
open pins.
Also upper data lines (15:8) of flash circuit D210 are not included to this
test.
open pins.
Also upper data lines (15:8) of flash circuit D210 are not included to this
test.
CCONT pin 54
( PURX )
MAD pin 38
( MCUAD0)
MAD pin 134
( ExtSysResX))
selftest
passed
passed
J225