Intel E7-8891 v2 CM8063601377422 User Manual

Product codes
CM8063601377422
Page of 504
Reliability, Availability, Serviceability, and Manageability
52
Intel
®
 Xeon
® 
Processor E7-2800/4800/8800 v2 Product Family
Datasheet Volume Two: Functional Description, February 2014
7.1.1
Error Sources
In general two kinds of errors could occur in a system - Hard Errors or Soft Errors. Hard 
Errors are caused by various sources of electrical noise or by electrical marginality of 
the physical links and power supplies. Hard errors generally manifest as ‘stuck-lane’ or 
‘stuck-bit’. 
Note:
Within the silicon, often “Hard Errors” are defined as permanent circuit level faults. 
Such hard errors are usually associated with manufacturing defects or marginality that 
can be screened out by the silicon testing process.
While Hard errors are easy to comprehend, Soft errors requires additional explanation.
7.1.1.1
Soft Errors
VLSI circuits are in general susceptible to Soft Errors. Soft Errors are random false logic 
values that are caused by the outside environment. Soft Errors could occur in any good 
part in a system.
Unless indicated specifically, this chapter uses term “Errors” to represent both soft 
errors and hard errors. 
7.1.2
Error Classification
Processor detected errors can be classified as 
Some of detected errors can be easily corrected using built-in features such as ECC in 
iMC modules and these types of errors are called “Corrected Errors” (CE). Uncorrected 
non-data errors such as DDR3 address/control parity errors are considered as fatal 
errors. The other remaining detected errors are uncorrected data errors (UC errors). 
When Intel Xeon processor E7 v2 product family is configured in “Legacy IA-32 MCA” 
Figure 7-1. Error Classification
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