Microchip Technology IC MCU 8BIT PIC18F65K22-I/PT TQFP-64 MCP PIC18F65K22-I/PT Data Sheet
Product codes
PIC18F65K22-I/PT
2011 Microchip Technology Inc.
DS39960D-page 485
PIC18F87K22 FAMILY
31.0
ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings
(†)
Ambient temperature under bias.............................................................................................................-40°C to +125°C
Storage temperature .............................................................................................................................. -65°C to +150°C
Voltage on any digital only I/O pin with respect to V
Storage temperature .............................................................................................................................. -65°C to +150°C
Voltage on any digital only I/O pin with respect to V
SS
(except V
DD
)........................................................... -0.3V to 7.5V
Voltage on MCLR with respect to V
SS
........................................................................................................... 0.3V to 9.0V
Voltage on any combined digital and analog pin with respect to V
SS
(except V
DD
and MCLR)...... -0.3V to (V
DD
+ 0.3V)
Voltage on V
DD
with respect to V
SS
(with regulator enabled) ..................................................................... -0.3V to 5.5V
Voltage on V
DD
with respect to V
SS
(with regulator disabled)..................................................................... -0.3V to 3.6V
)
..................................................................................................................................1W
Maximum current out of V
SS
pin ...........................................................................................................................300 mA
Maximum current into V
DD
pin ..............................................................................................................................250 mA
Input clamp current, I
IK
(V
I
< 0 or V
I
> V
DD
) ..........................................................................................................±20 mA
Output clamp current, I
OK
(V
O
< 0 or V
O
> V
DD
) ...................................................................................................±20 mA
Maximum output current sunk by PORTA<7:6> and any PORTB and PORTC I/O pins.........................................25 mA
Maximum output current sunk by any PORTD, PORTE and PORTJ I/O pins ..........................................................8 mA
Maximum output current sunk by PORTA<5:0> and any PORTF, PORTG and PORTH I/O pins ............................2 mA
Maximum output current sourced by PORTA<7:6> and any PORTB and PORTC I/O pins ...................................25 mA
Maximum output current sourced by any PORTD, PORTE and PORTJ I/O pins .....................................................8 mA
Maximum output current sourced by PORTA<5:0> and any PORTF, PORTG and PORTH I/O pins .......................2 mA
Maximum current sunk by
Maximum output current sunk by any PORTD, PORTE and PORTJ I/O pins ..........................................................8 mA
Maximum output current sunk by PORTA<5:0> and any PORTF, PORTG and PORTH I/O pins ............................2 mA
Maximum output current sourced by PORTA<7:6> and any PORTB and PORTC I/O pins ...................................25 mA
Maximum output current sourced by any PORTD, PORTE and PORTJ I/O pins .....................................................8 mA
Maximum output current sourced by PORTA<5:0> and any PORTF, PORTG and PORTH I/O pins .......................2 mA
Maximum current sunk by
all ports combined.......................................................................................................200 mA
Note 1:
Power dissipation is calculated as follows:
Pdis = V
Pdis = V
DD
x {I
DD
–
I
OH
} +
{(V
DD
– V
OH
) x I
OH
} +
(V
OL
x I
OL
)
† NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.