Microchip Technology MA330020 Data Sheet

Page of 398
dsPIC33FJ06GS101/X02 and dsPIC33FJ16GSX02/X04
DS70000318G-page 296
 2008-2014 Microchip Technology Inc.
I
ICL
Input Low Injection Current
DI60a
0
-5
(
,
mA
All pins except V
DD
, V
SS
AV
DD
, AV
SS
, MCLR, 
V
CAP
 and RB5
I
ICH
Input High Injection Current
DI60b
0
+5
(
,
mA
All pins except V
DD
, V
SS
AV
DD
, AV
SS
, MCLR, 
V
CAP
, RB5 and digital 
5V-tolerant designated 
pins
I
ICT
Total Input Injection Current
DI60c
(sum of all I/O and control pins)
-20
(
)
+20
(
mA
Absolute instantaneous 
sum of all ± input 
injection currents from 
all I/O pins
( |  I
ICL
 + | I
ICH
  | ) 
  I
ICT
TABLE 24-9:
DC CHARACTERISTICS: I/O PIN INPUT SPECIFICATIONS (CONTINUED)
DC CHARACTERISTICS
Standard Operating Conditions: 3.0V to 3.6V
(unless otherwise stated)
Operating temperature
-40°C 
 T
A
 
 +85°C for Industrial
-40°C 
 T
A
 
 +125°C for Extended
Param
 No.
Symbol
Characteristic
Min
Typ
(
1
)
Max
Units
Conditions
Note 1:
Data in “Typ” column is at 3.3V, +25°C unless otherwise stated.
2:
The leakage current on the MCLR pin is strongly dependent on the applied voltage level. The specified 
levels represent normal operating conditions. Higher leakage current may be measured at different input 
voltages.
3:
Negative current is defined as current sourced by the pin.
4:
See 
Pin Diagrams
 for the list of 5V tolerant I/O pins.
5:
V
IL
 source < (V
SS
 – 0.3). Characterized but not tested.
6:
Non-5V tolerant pins V
IH
 source > (V
DD
 + 0.3), 5V tolerant pins V
IH
 source > 5.5V. Characterized but not 
tested.
7:
Digital 5V tolerant pins cannot tolerate any “positive” input injection current from input sources > 5.5V.
8:
Injection currents > | 0 | can affect the ADC results by approximately 4-6 counts. 
9:
Any number and/or combination of I/O pins not excluded under I
ICL
 or I
ICH
 conditions are permitted pro-
vided the mathematical “absolute instantaneous” sum of the input injection currents from all pins do not 
exceed the specified limit. Characterized but not tested.